EIA RS-186-11E

STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 11: THERMAL SHOCK IN AIR

contributor author	EIA - Electronic Industries Alliance
date accessioned	2017-09-04T16:41:25Z
date available	2017-09-04T16:41:25Z
date copyright	28764
date issued	1978
identifier other	VPAVDFAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std/handle/yse/104695
description abstract	PURPOSE This test is conducted for the purpose of determining the resistance of a component part to exposures at ! extremes of high and low temperatures in air, and to the shock of alternate exposures to these extremes. Permanent changes in operating characteristics and physical darnage produced during thermal shock result principally from variations in dimensions and other physical properties. Effects of thermal shock include cracking and delamination of finishes, cracking and crazing of embedding and encapsulating compounds, opening of terminal seals and case seams, leakage of filling materials, and change in efectricai characteristics- due to mechanical displacement or rupture of conductors or of insulating materials.
language	English
title	EIA RS-186-11E	num
title	STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 11: THERMAL SHOCK IN AIR	en
type	standard
page	5
status	Active
tree	EIA - Electronic Industries Alliance:;1978
contenttype	fulltext