IEC 60747-5-3
English -- Discrete semiconductor devices and integrated circuits – Part 5-3: Optoelectronic devices – Measuring methods - Edition 1.1; Consolidated Reprint;
French -- Dispositifs discrets à semiconducteurs et circuits intégrés – Partie 5-3: Dispositifs optoélectroniques – Méthodes de mesure - Edition 1.1; Consolidated Reprint
Organization:
IEC - International Electrotechnical Commission
Year: 2009
Abstract: This part of IEC 60747 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
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contributor author | IEC - International Electrotechnical Commission | |
date accessioned | 2017-09-04T16:47:54Z | |
date available | 2017-09-04T16:47:54Z | |
date copyright | 2009.11.01 | |
date issued | 2009 | |
identifier other | WGOJPCAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std/handle/yse/111279 | |
description abstract | This part of IEC 60747 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. | |
language | English, French | |
title | IEC 60747-5-3 | num |
title | English -- Discrete semiconductor devices and integrated circuits – Part 5-3: Optoelectronic devices – Measuring methods - Edition 1.1; Consolidated Reprint | en |
title | French -- Dispositifs discrets à semiconducteurs et circuits intégrés – Partie 5-3: Dispositifs optoélectroniques – Méthodes de mesure - Edition 1.1; Consolidated Reprint | other |
type | standard | |
page | 90 | |
status | Active | |
tree | IEC - International Electrotechnical Commission:;2009 | |
contenttype | fulltext |