NASA-LLIS-0316

Lessons Learned – Connector Savers, Bent Pins, Open or Short Circuit

contributor author	NASA - National Aeronautics and Space Administration (NASA)
date accessioned	2017-09-04T17:19:20Z
date available	2017-09-04T17:19:20Z
date copyright	08/03/1993
date issued	1993
identifier other	ZNAEQCAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std/handle/yse/142539
description abstract	Description of Driving Event: In ECLSS Flight Experiment (EFE) testing, damage to the pins in electrical connectors occurred as a result of excessive mating/demating. Schedule delays resulted.
language	English
title	NASA-LLIS-0316	num
title	Lessons Learned – Connector Savers, Bent Pins, Open or Short Circuit	en
type	standard
page	2
status	Active
tree	NASA - National Aeronautics and Space Administration (NASA):;1993
contenttype	fulltext
subject keywords	Flight Equipment
subject keywords	Ground Equipment
subject keywords	Hardware
subject keywords	Logistics