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NASA-LLIS-0316
Lessons Learned – Connector Savers, Bent Pins, Open or Short Circuit
Year: 1993
Abstract: Description of Driving Event:
In ECLSS Flight Experiment (EFE) testing, damage to the pins in electrical connectors occurred as a result of excessive mating/demating. Schedule delays resulted.
In ECLSS Flight Experiment (EFE) testing, damage to the pins in electrical connectors occurred as a result of excessive mating/demating. Schedule delays resulted.
Subject: Flight Equipment
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| contributor author | NASA - National Aeronautics and Space Administration (NASA) | |
| date accessioned | 2017-09-04T17:19:20Z | |
| date available | 2017-09-04T17:19:20Z | |
| date copyright | 08/03/1993 | |
| date issued | 1993 | |
| identifier other | ZNAEQCAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std/handle/yse/142539 | |
| description abstract | Description of Driving Event: In ECLSS Flight Experiment (EFE) testing, damage to the pins in electrical connectors occurred as a result of excessive mating/demating. Schedule delays resulted. | |
| language | English | |
| title | NASA-LLIS-0316 | num |
| title | Lessons Learned – Connector Savers, Bent Pins, Open or Short Circuit | en |
| type | standard | |
| page | 2 | |
| status | Active | |
| tree | NASA - National Aeronautics and Space Administration (NASA):;1993 | |
| contenttype | fulltext | |
| subject keywords | Flight Equipment | |
| subject keywords | Ground Equipment | |
| subject keywords | Hardware | |
| subject keywords | Logistics |