02/209644 DC
IEC 60749-28. Ed.1. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM)
Organization:
BSI - British Standards Institution
Year: 2002
Abstract: Semiconductor devices, Integrated circuits, Electronic equipment and components, Test methods, Mechanical testing, Environmental testing, Electric charge, Electric discharges, Electrostatics
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contributor author | BSI - British Standards Institution | |
date accessioned | 2017-09-04T17:54:07Z | |
date available | 2017-09-04T17:54:07Z | |
date copyright | 37540 | |
date issued | 2002 | |
identifier other | 000000000030084226.pdf | |
identifier uri | http://yse.yabesh.ir/std/handle/yse/177240 | |
description abstract | Semiconductor devices, Integrated circuits, Electronic equipment and components, Test methods, Mechanical testing, Environmental testing, Electric charge, Electric discharges, Electrostatics | |
language | English | |
title | 02/209644 DC | num |
title | IEC 60749-28. Ed.1. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM) | en |
type | standard | |
page | 12 | |
status | Current, Draft for public comment | |
tree | BSI - British Standards Institution:;2002 | |
contenttype | fulltext |