21/30427709 DC. BS IEC 63287-2. Semiconductor devices. Guidelines for reliability qualification plans. Part 2. Concept of mission profile
21/30427709 DC
Organization:
BSI - British Standards Institution
Year: 2021
Subject: Electrical equipment
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21/30427709 DC. BS IEC 63287-2. Semiconductor devices. Guidelines for reliability qualification plans. Part 2. Concept of mission profile
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contributor author | BSI - British Standards Institution | |
date accessioned | 2022-02-14T04:22:10Z | |
date available | 2022-02-14T04:22:10Z | |
date copyright | February 2021 | |
date issued | 2021 | |
identifier other | 000000000030427709.pdf | |
identifier uri | http://yse.yabesh.ir/std/handle/yse/295463 | |
description | Purchase your copy of 21/30427709 DC as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards available online in electronic and print formats. | |
language | English | |
title | 21/30427709 DC. BS IEC 63287-2. Semiconductor devices. Guidelines for reliability qualification plans. Part 2. Concept of mission profile | en |
title | 21/30427709 DC | num |
type | Standard | |
status | Current, Draft for public comment | |
tree | BSI - British Standards Institution:;2021 | |
contenttype | Fulltext | |
subject keywords | Electrical equipment | |
subject keywords | Semiconductor technology | |
subject keywords | Doping (semiconductors) | |
subject keywords | Semiconductor switches | |
subject keywords | Semiconductor materials |