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JEDEC JESD24-2
Gate Charge Test Method - Addendum to JEDEC JESD 24
Organization:
JEDEC - Solid State Technology Association
Year: 2002
Abstract: This addendum establishes a method for measuring power device gate charge. A gate charge test is performed by driving the device gate with a constant current and measuring the resulting gate voltage response. Constant gate current scales the gate voltage, a function of time, to a function of coulombs. The slope of the generated response reflects the active device capacitance as it varies during the switching transition . Gate charge measurements are useful for characterizing the large signal switching performance of power MOS and IGBT devices. Developed over a four year span by the JEDEC JC-25 Committee, the method defines a repeatable means of measuring the widely published Qgd charge values.
Subject: Gate Charge
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T17:08:38Z | |
| date available | 2017-09-04T17:08:38Z | |
| date copyright | 01/01/1991 (R 2002) | |
| date issued | 2002 | |
| identifier other | YKTZJBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/132105 | |
| description abstract | This addendum establishes a method for measuring power device gate charge. A gate charge test is performed by driving the device gate with a constant current and measuring the resulting gate voltage response. Constant gate current scales the gate voltage, a function of time, to a function of coulombs. The slope of the generated response reflects the active device capacitance as it varies during the switching transition . Gate charge measurements are useful for characterizing the large signal switching performance of power MOS and IGBT devices. Developed over a four year span by the JEDEC JC-25 Committee, the method defines a repeatable means of measuring the widely published Qgd charge values. | |
| language | English | |
| title | JEDEC JESD24-2 | num |
| title | Gate Charge Test Method - Addendum to JEDEC JESD 24 | en |
| type | standard | |
| page | 14 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2002 | |
| contenttype | fulltext | |
| subject keywords | Gate Charge | |
| subject keywords | Test Method - Gate Charge |