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JEDEC JESD57

Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation

Organization:
JEDEC - Solid State Technology Association
Year: 1996

Abstract: This test method defines requirements and procedures for ground simulation and single event effects (SEE) and implementation of the method in testing integrated circuits. This standard is valid when using a cyclotron or Van de Graaff accelerator. Microcircuits under test must be delidded. The ions used at the facilities have an atomic number Z > 2. It does not apply to SEE testing that uses protons, neutrons, or other lighter particles. This standard is designed to eliminate any misunderstanding between users of the method and test facilities, to minimize delays, and to promote standardization of testing and test data.
URI: http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/146960
Subject: Heavy Ion Irradiation
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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T17:23:45Z
date available2017-09-04T17:23:45Z
date copyright35400
date issued1996
identifier otherZZXNCAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/146960
description abstractThis test method defines requirements and procedures for ground simulation and single event effects (SEE) and implementation of the method in testing integrated circuits. This standard is valid when using a cyclotron or Van de Graaff accelerator. Microcircuits under test must be delidded. The ions used at the facilities have an atomic number Z > 2. It does not apply to SEE testing that uses protons, neutrons, or other lighter particles. This standard is designed to eliminate any misunderstanding between users of the method and test facilities, to minimize delays, and to promote standardization of testing and test data.
languageEnglish
titleJEDEC JESD57num
titleTest Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiationen
typestandard
page49
statusActive
treeJEDEC - Solid State Technology Association:;1996
contenttypefulltext
subject keywordsHeavy Ion Irradiation
subject keywordsSingle-Event Effects - SEE
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