JEDEC JESD57
Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
Organization:
JEDEC - Solid State Technology Association
Year: 1996
Abstract: This test method defines requirements and procedures for ground simulation and single event effects (SEE) and implementation of the method in testing integrated circuits. This standard is valid when using a cyclotron or Van de Graaff accelerator. Microcircuits under test must be delidded. The ions used at the facilities have an atomic number Z > 2. It does not apply to SEE testing that uses protons, neutrons, or other lighter particles. This standard is designed to eliminate any misunderstanding between users of the method and test facilities, to minimize delays, and to promote standardization of testing and test data.
Subject: Heavy Ion Irradiation
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contributor author | JEDEC - Solid State Technology Association | |
date accessioned | 2017-09-04T17:23:45Z | |
date available | 2017-09-04T17:23:45Z | |
date copyright | 35400 | |
date issued | 1996 | |
identifier other | ZZXNCAAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/146960 | |
description abstract | This test method defines requirements and procedures for ground simulation and single event effects (SEE) and implementation of the method in testing integrated circuits. This standard is valid when using a cyclotron or Van de Graaff accelerator. Microcircuits under test must be delidded. The ions used at the facilities have an atomic number Z > 2. It does not apply to SEE testing that uses protons, neutrons, or other lighter particles. This standard is designed to eliminate any misunderstanding between users of the method and test facilities, to minimize delays, and to promote standardization of testing and test data. | |
language | English | |
title | JEDEC JESD57 | num |
title | Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation | en |
type | standard | |
page | 49 | |
status | Active | |
tree | JEDEC - Solid State Technology Association:;1996 | |
contenttype | fulltext | |
subject keywords | Heavy Ion Irradiation | |
subject keywords | Single-Event Effects - SEE |