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JEDEC JESD89-1A

Test Method for Real-Time Soft Error Rate

Organization:
JEDEC - Solid State Technology Association
Year: 2007

Abstract: This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or re-writing to correct and as used in terrestrial environments. It simulates the operating condition of the device and is used for qualification, characterization, or reliability monitoring. This test is intended for execution in ambient conditions without the artificial introduction of radiation sources.
URI: http://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/136346
Subject: Error Rate
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    JEDEC JESD89-1A

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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T17:12:46Z
date available2017-09-04T17:12:46Z
date copyright39356
date issued2007
identifier otherYWOFBCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/136346
description abstractThis test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or re-writing to correct and as used in terrestrial environments. It simulates the operating condition of the device and is used for qualification, characterization, or reliability monitoring. This test is intended for execution in ambient conditions without the artificial introduction of radiation sources.
languageEnglish
titleJEDEC JESD89-1Anum
titleTest Method for Real-Time Soft Error Rateen
typestandard
page12
statusActive
treeJEDEC - Solid State Technology Association:;2007
contenttypefulltext
subject keywordsError Rate
subject keywordsLife Test
subject keywordsReal-Time
subject keywordsSER
subject keywordsSystem
subject keywordsTest Method - Soft Error Rate
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