JEDEC EIA-323

Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T17:35:54Z
date available	2017-09-04T17:35:54Z
date copyright	03/01/1966 (R 1972)(R 2002)
date issued	2002
identifier other	DJDICAAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/158781
description abstract	This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.
language	English
title	JEDEC EIA-323	num
title	Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices	en
type	standard
page	6
status	Active
tree	JEDEC - Solid State Technology Association:;2002
contenttype	fulltext
subject keywords	Air Convection Cooled Life Test
subject keywords	Environment of Life Test for Lead-Mounted Devices
subject keywords	Life Testing - Lead Mounted Semiconductor Devices