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RISJEDEC JESD51: Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device)
Abstract: This standard and its subsequent addendum's, provides a standard for thermal measurement that, if followed fully, will provide correct and meaningful data that will allow for determination of junction temperature for ...
JEDEC JESD48C: Product Discontinuance
Abstract: This standard is applicable to suppliers of, and affected customers for, solid-state products.
This standard establishes the requirements for timely customer notification of planned product discontinuance, which will ...
This standard establishes the requirements for timely customer notification of planned product discontinuance, which will ...
JEDEC JESD89A: Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
Abstract: This specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and acceleratedtesting ...
JEDEC JESD8-23: Unified Wide Power Supply Voltage Range CMOS DC Interface Standard for Non-Terminated Digital Integrated Circuits
Abstract: This standard defines DC interface parameters and test conditions for a family of non-terminated CMOS digital circuits intended for use over a wide power supply voltage range. The standard bridges a number of existing JEDEC ...
JEDEC JESD63: Standard Method for Calculating the Electromigration Model Parameters for Current Density and Temperature
Abstract: This method provides procedures to calculate sample estimates and their confidence intervals for the electromigration model parameters of current density and temperature. The model parameter for current density is the ...
JEDEC JEP152: DDR2 DIMM Clock Skew Measurement Procedure Using A Clock Reference Board
Abstract: This document is the work product of the JC-45.1 DDR2 DIMM Clock Skew Measurement task group.The purpose of this document is to define procedures to measure clock parameters on registered DIMMs using the DDR2 Clock Reference ...
JEDEC JESD37: Standard for Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
Abstract: This standard details techniques for estimating the values of a two parameter lognormal distribution from complete lifetime data (all samples in an experiment have failed) or singly right-censored lifetime data (the ...
JEDEC JESD18-A: Standard for Description of Fast CMOS TTL Compatible Logic
Abstract: The purpose of this standard is to provide for uniformity, multiplicity of sources, elimination of confusion, and ease of device specification and design by users. The standard covers specifications for description of ...
JEDEC JESD24-3: Thermal Impedance Measurements for Vertical Power MOSFETs (Delta Source-Drain Voltage Method) - Addendum to JEDEC JESD 24
Abstract: The purpose of this test method is to measure the thermal impedance of the MOSFET under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity if the forward voltage drop of ...