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RISJEDEC JESD99C: Terms, Definitions, and Letter Symbols for Microelectronic Devices
Abstract: Foreword
This standard will prove to be a useful guide for users, manufacturers, educators, technical writers, and others interested in the characterization, nomenclature, and classification of ...
This standard will prove to be a useful guide for users, manufacturers, educators, technical writers, and others interested in the characterization, nomenclature, and classification of ...
JEDEC JESD51: Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device)
Abstract: This standard and its subsequent addendum's, provides a standard for thermal measurement that, if followed fully, will provide correct and meaningful data that will allow for determination of junction temperature for ...
JEDEC JEP106AB: Standard Manufacturer’s Identification Code
Abstract: The manufacturer's identification code is defined by one or more eight (8) bit fields, each consisting of seven (7) data bits plus one (1) odd parity bit. The manufacturer's identification code as shown in Table 1, is ...
JEDEC JESD63: Standard Method for Calculating the Electromigration Model Parameters for Current Density and Temperature
Abstract: This method provides procedures to calculate sample estimates and their confidence intervals for the electromigration model parameters of current density and temperature. The model parameter for current density is the ...
JEDEC JESD282B.01: Silicon Rectifier Diodes - Revision of EIA-JESD282-B
Abstract: This standard provided definitions, electrical characteristics circuit technology, letter symbols and registration format for diodes and stacks. It also covers rating and characteristics, manufacturing and performance as ...
JEDEC JESD82-21: Standard for Definition of CUA845 PLL Clock Driver for Registered DDR2 DIMM Applications
Abstract: This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of a CUA845 PLL clock device for registered DDR2 DIMM applications.The purpose is to provide ...
JEDEC JEP152: DDR2 DIMM Clock Skew Measurement Procedure Using A Clock Reference Board
Abstract: This document is the work product of the JC-45.1 DDR2 DIMM Clock Skew Measurement task group.The purpose of this document is to define procedures to measure clock parameters on registered DIMMs using the DDR2 Clock Reference ...
JEDEC JESD48C: Product Discontinuance
Abstract: This standard is applicable to suppliers of, and affected customers for, solid-state products.
This standard establishes the requirements for timely customer notification of planned product discontinuance, which will ...
This standard establishes the requirements for timely customer notification of planned product discontinuance, which will ...
JEDEC JESD51-13: Glossary of Thermal Measurement Terms and Definitions
Abstract: This document provides a unified collection of the commonly used terms and definitions in the area of semiconductor thermal measurements. The terms and definitions provided herein extend beyond those used in the JESD51 ...