SMD-5962-93112

DLA - CC - DLA Land and Maritime

MICROCIRCUIT, DIGITAL, CMOS, PROGRAMMABLE SKEW CLOCK BUFFER, MONOLITHIC SILICON

Organization:

Year: 1994

Abstract: This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:

         Device type     Generic number            Circuit function            Skew error                01             7B992          Programmable skew clock buffer      0.7 ns

The device class designator shall be a single letter identifying the product assurance level as follows:

         Device class                    Device requirements documentation                M            Vendor self-certification to the requirements for non-JAN class B                            microcircuits in accordance with 1.2.1 of MIL-STD-883              Q or V         Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

         Outline letter      Descriptive designator      Terminals      Package style                 X                   CQCC1-N32                 32         Leadless chip carrier

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

       Supply voltage range (V_CCN, V_CCQ) - - - - - - - - - - - - -     −0.5 V dc to +7.0 V dc        DC input voltage range (V_IN)- - - - - - - - - - - - - - - -     −0.5 V dc to +7.0 V dc        Output current into outputs (Low) (I_OL) - - - - - - - - - -     64 mA        Storage temperature range (T_STG)- - - - - - - - - - - - - -     −65°C to +150°C        Maximum power dissipation (P_D)- - - - - - - - - - - - - - -     911 mW        Lead temperature (soldering, 10 seconds)- - - - - - - - - -     +260°C        Thermal resistance, junction-to-case (Θ_JC)- - - - - - - - -     See MIL-STD-1835        Junction temperature (T_J) - - - - - - - - - - - - - - - - -     +175°C

       Supply voltage range (V_CCN, V_CCQ) - - - - - - - - - - - - -     +4.5 V dc to +5.5 V dc        Input voltage range (V_IN) - - - - - - - - - - - - - - - - -     0.0 V dc to V_CCQ        Output voltage range (V_OUT) - - - - - - - - - - - - - - - -     0.0 V dc to V_CCN        High Level input voltage range (V_IH, V_IHH):          V_IH - - - - - - - - - - - - - - - - - - - - - - - - - - -     V_CCQ − 1.35 V dc to V_CCQ 4/          V_IHH- - - - - - - - - - - - - - - - - - - - - - - - - - -     V_CCQ − 1.00 V dc to V_CCQ 5/ 6/        Mid level input voltage range (V_IMM)  - - - - - - - - - - -     V_CCQ/2 ±500 mV dc 5/        Low level input voltage range (V_IL, V_ILL):          V_IL - - - - - - - - - - - - - - - - - - - - - - - - - - -     −0.0 V dc to 1.35 V dc 4/          V_ILL- - - - - - - - - - - - - - - - - - - - - - - - - - -     0.0 V dc to 1.0 V dc 5/ 6/        Case operating temperature (T_C) - - - - - - - - - - - - - -     −55°C to +125°C        Input rise or fall time (t_r, t_f):          (0.2V_CC to 0.8V_CC: 0.8V_CC to 0.2V_CC)- - - - - - - - - - -     0 to 3 ns        Maximum high level output current (I_OH) - - - - - - - - - -     −40 mA        Maximum low level output current (I_OL)- - - - - - - - - - -     +46 mA

      Fault coverage measurement of manufacturing          logic tests (MIL-STD-883, test method 5012) - - - - - -     XX percent 7/

Intended Use: Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. Device class Q devices will replace device class M devices.

URI: https://yse.yabesh.ir/std/handle/yse/182301

Collections :

DLA - CC - DLA Land and Maritime

Show full item record

contributor author	DLA - CC - DLA Land and Maritime
date accessioned	2017-09-04T17:59:12Z
date available	2017-09-04T17:59:12Z
date copyright	09/13/1994
date issued	1994
identifier other	FTNYDAAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/182301
description abstract	This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. The PIN shall be as shown in the following example: Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function Skew error 01 7B992 Programmable skew clock buffer 0.7 ns The device class designator shall be a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535 The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X CQCC1-N32 32 Leadless chip carrier The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference. Supply voltage range (V_CCN, V_CCQ) - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc DC input voltage range (V_IN)- - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Output current into outputs (Low) (I_OL) - - - - - - - - - - 64 mA Storage temperature range (T_STG)- - - - - - - - - - - - - - −65°C to +150°C Maximum power dissipation (P_D)- - - - - - - - - - - - - - - 911 mW Lead temperature (soldering, 10 seconds)- - - - - - - - - - +260°C Thermal resistance, junction-to-case (Θ_JC)- - - - - - - - - See MIL-STD-1835 Junction temperature (T_J) - - - - - - - - - - - - - - - - - +175°C Supply voltage range (V_CCN, V_CCQ) - - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Input voltage range (V_IN) - - - - - - - - - - - - - - - - - 0.0 V dc to V_CCQ Output voltage range (V_OUT) - - - - - - - - - - - - - - - - 0.0 V dc to V_CCN High Level input voltage range (V_IH, V_IHH): V_IH - - - - - - - - - - - - - - - - - - - - - - - - - - - V_CCQ − 1.35 V dc to V_CCQ 4/ V_IHH- - - - - - - - - - - - - - - - - - - - - - - - - - - V_CCQ − 1.00 V dc to V_CCQ 5/ 6/ Mid level input voltage range (V_IMM) - - - - - - - - - - - V_CCQ/2 ±500 mV dc 5/ Low level input voltage range (V_IL, V_ILL): V_IL - - - - - - - - - - - - - - - - - - - - - - - - - - - −0.0 V dc to 1.35 V dc 4/ V_ILL- - - - - - - - - - - - - - - - - - - - - - - - - - - 0.0 V dc to 1.0 V dc 5/ 6/ Case operating temperature (T_C) - - - - - - - - - - - - - - −55°C to +125°C Input rise or fall time (t_r, t_f): (0.2V_CC to 0.8V_CC: 0.8V_CC to 0.2V_CC)- - - - - - - - - - - 0 to 3 ns Maximum high level output current (I_OH) - - - - - - - - - - −40 mA Maximum low level output current (I_OL)- - - - - - - - - - - +46 mA Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - XX percent 7/ Intended Use: Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. Device class Q devices will replace device class M devices.
language	English
title	SMD-5962-93112	num
title	MICROCIRCUIT, DIGITAL, CMOS, PROGRAMMABLE SKEW CLOCK BUFFER, MONOLITHIC SILICON	en
type	standard
page	20
status	Active
tree	DLA - CC - DLA Land and Maritime:;1994
contenttype	fulltext