JEDEC JESD311A

Measurement of Transistor Noise Figure at MF, HF, and VHF

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T18:26:10Z
date available	2017-09-04T18:26:10Z
date copyright	11/01/1981 (R 2009)
date issued	2009
identifier other	IKQISCAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/208302
description abstract	FOREWORD This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This method is a revision of RS-311 and incorporates material previously found in RS-283, and as such rescinds RS-283 since it was found deficient in test method details and definitions for noise figure measurements. Also, RS-311-A adds the necessary information to make "effective input noise temperature" measurements. The noise definitions are identical to that found in JEDEC Standard No.77 and do not conflict with the IEC documents, found in 47 (Secretariat) 558/548 as approved in Tokyo, June 1975.
language	English
title	JEDEC JESD311A	num
title	Measurement of Transistor Noise Figure at MF, HF, and VHF	en
type	standard
page	26
status	Active
tree	JEDEC - Solid State Technology Association:;2009
contenttype	fulltext