JEDEC EIA-318-B

Measurement of Reverse Recovery Time for Semiconductor Signal Diodes

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T18:37:25Z
date available	2017-09-04T18:37:25Z
date copyright	07/01/1996 (R 1999)
date issued	1999
identifier other	JNJTCBAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/219293
description abstract	This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.
language	English
title	JEDEC EIA-318-B	num
title	Measurement of Reverse Recovery Time for Semiconductor Signal Diodes	en
type	standard
page	19
status	Active
tree	JEDEC - Solid State Technology Association:;1999
contenttype	fulltext
subject keywords	Diodes
subject keywords	Measurement
subject keywords	Reverse Recovery Time
subject keywords	Signal Diodes