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IEEE 1149.7

Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture - IEEE Computer Society

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2017-09-04T15:22:05Z
date available2017-09-04T15:22:05Z
date copyright40156
date issued2009
identifier otherATLIQCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std/handle/yse/22101
description abstractThe standard will define a link between IEEE 1149.1 interfaces in Debug and Test Systems (DTS) and IEEE 1149.1 (JTAG) interfaces in Target Systems (TS). The link defined by this standard introduces an additional layer between these legacy interfaces. This layer may be viewed as an adapter that provides new functionality and features while preserving all elements of the original IEEE 1149.1 (JTAG) interfaces. The standard will define the link behavior (including timing characteristics of signals), protocols, and functionality of the adapters deployed within the DTS and TS. The standard will not modify or create inconsistencies with IEEE 1149.1 (JTAG). The standard will define a superset of the IEEE 1149.1 specification and achieve compliance with IEEE Std 1149.1TM-2001.1
Purpose
The purpose of the standard is to define a debug and test interface that meets an expanding set of challenges facing Debug and Test Systems (many of which have emerged since the inception of the original IEEE Std 1149.1) while preserving the hardware and software investments of the many industries currently using IEEE Std 1149.1-2001.
1 Information on references can be found in Clause 2.
languageEnglish
titleIEEE 1149.7num
titleReduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture - IEEE Computer Societyen
typestandard
page1037
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2009
contenttypefulltext
subject keywords1149.1
subject keywords1149.7
subject keywords2-pin
subject keywords2-wire
subject keywords4-pin
subject keywords4-wire
subject keywordsAdvanced Protocol
subject keywordsAdvanced Protocol Unit
subject keywordsAPU
subject keywordsBackground Data Transfer
subject keywordsbackground data transport
subject keywordsBDX
subject keywordsboundary scan
subject keywordsBSDL
subject keywordsBSDL.1
subject keywordsBSDL.7
subject keywordsBYPASS
subject keywordsCapture-IR
subject keywordsCDX
subject keywordsChip-Level TAP Controller
subject keywordsCID
subject keywordsClass T0
subject keywordsClass T1
subject keywordsClass T2
subject keywordsClass T3
subject keywordsClass T4
subject keywordsClass T5
subject keywordsCLTAPC
subject keywordscompact JTAG
subject keywordscompliant behavior
subject keywordscompliant operation
subject keywordscontrol level
subject keywordscontroller address
subject keywordsController ID
subject keywordsController Identification Number
subject keywordsCP
subject keywordsCustom Data Transfer
subject keywordscustom data transport
subject keywordsData Register
subject keywordsdebug and test interface
subject keywordsdebug interface
subject keywordsdebug logic
subject keywordsDebug Test System
subject keywordsdebug test target
subject keywordsDOT1
subject keywordsDOT7
subject keywordsDTI
subject keywordsDTS
subject keywordsDTT
subject keywordsEOT
subject keywordsEPU
subject keywordsEscape
subject keywordsextended operation
subject keywordsExtended Protocol
subject keywordsEXTEST
subject keywordsHSDL
subject keywordsHSDL.7
subject keywordsIDCODE
subject keywordsInstruction Register
subject keywordsJScan
subject keywordsJScan0
subject keywordsJScan1
subject keywordsJScan2
subject keywordsJScan3
subject keywordsJTAG
subject keywordsMScan
subject keywordsMTCP
subject keywordsMulti-TAP Control Path
subject keywordsnarrow Star Scan Topology
subject keywordsnTRST
subject keywordsnTRST_PD
subject keywordsoptimized scan
subject keywordsOScan
subject keywordsOScan0
subject keywordsOScan1
subject keywordsOScan2
subject keywordsOScan3
subject keywordsOScan4
subject keywordsOScan5
subject keywordsOScan6
subject keywordsOScan7
subject keywordsPause-DR
subject keywordsPause-IR
subject keywordsPC0
subject keywordsPC1
subject keywordsReset and selection unit
subject keywordsRSU
subject keywordsRTI
subject keywordsRun-Test/Idle
subject keywordsscan
subject keywordsscan DR
subject keywordsscan format
subject keywordsscan IR
subject keywordsScan Packet
subject keywordsscan path
subject keywordsscan performance
subject keywordsscan protocol
subject keywordsScan Selection Directive
subject keywordsScan Topology
subject keywordsseries
subject keywordsSeries Branch
subject keywordsSeries Scan
subject keywordsSeries Scan Topology
subject keywordsSeries Topology
subject keywordsSeries-Equivalent Scan
subject keywordsShift-DR
subject keywordsShift-IR
subject keywordsSiP
subject keywordsSP
subject keywordsSScan
subject keywordsSScan0
subject keywordsSScan1
subject keywordsSScan2
subject keywordsSScan3
subject keywordsSSD
subject keywordsstall
subject keywordsStandard Protocol
subject keywordsstar scan
subject keywordsStar Scan Topology
subject keywordsStar Topology
subject keywordsStar-2
subject keywordsStar-2 Branch
subject keywordsStar-2 Scan
subject keywordsStar-4
subject keywordsStar-4 Branch
subject keywordsStar-4 Scan
subject keywordsStar-4 Scan Topology
subject keywordsSTL
subject keywordsSystem Test Logic
subject keywordsT0
subject keywordsT0 TAP.7
subject keywordsT1
subject keywordsT1 TAP.7
subject keywordsT2
subject keywordsT2 TAP.7
subject keywordsT3
subject keywordsT3 TAP.7
subject keywordsT4
subject keywordsT4 TAP.7
subject keywordsT4(N)
subject keywordsT4(N) TAP.7
subject keywordsT4(W)
subject keywordsT4(W) TAP.7
subject keywordsT5
subject keywordsT5 TAP.7
subject keywordsT5(N)
subject keywordsT5(N) TAP.7
subject keywordsT5(W)
subject keywordsT5(W) TAP.7
subject keywordsTAP
subject keywordsTAP controller
subject keywordsTAP controller address
subject keywordsTAP selection
subject keywordsTAP.1
subject keywordsTAP.7
subject keywordsTAPC
subject keywordsTCA
subject keywordsTCKC
subject keywordsTDI
subject keywordsTDIC
subject keywordsTDOC
subject keywordsTDOE
subject keywordsTest Access Port
subject keywordstest and debug
subject keywordsTest-Logic-Reset
subject keywordsTLR
subject keywordsTMSC
subject keywordsTP
subject keywordsTransport Packet
subject keywordsUpdate-DR
subject keywordsUpdate-IR
subject keywordsZBS
subject keywordszero bit scan


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