JEDEC JEP118

Guidelines for GaAs MMIC and FET Life Testing

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T18:04:06Z
date available	2017-09-04T18:04:06Z
date copyright	01/01/1993
date issued	1993
identifier other	GFVWCAAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/186976
description abstract	These guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and capacitors. The purpose of this document is to define a standard approach for evaluating the expected live of GaAs MMICs so that results from different life tests can be compared and so that wording of this document that the MMIC contains at least one FET, but the use of this document has no such limitation.
language	English
title	JEDEC JEP118	num
title	Guidelines for GaAs MMIC and FET Life Testing	en
type	standard
page	20
status	Active
tree	JEDEC - Solid State Technology Association:;1993
contenttype	fulltext
subject keywords	FET Life Testing
subject keywords	GaAs FETs
subject keywords	MMIC Life Testing