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JEDEC JEP118

Guidelines for GaAs MMIC and FET Life Testing

Organization:
JEDEC - Solid State Technology Association
Year: 1993

Abstract: These guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and capacitors. The purpose of this document is to define a standard approach for evaluating the expected live of GaAs MMICs so that results from different life tests can be compared and so that wording of this document that the MMIC contains at least one FET, but the use of this document has no such limitation. 
URI: https://yse.yabesh.ir/std/handle/yse/186976
Subject: FET Life Testing
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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T18:04:06Z
date available2017-09-04T18:04:06Z
date copyright01/01/1993
date issued1993
identifier otherGFVWCAAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/186976
description abstractThese guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and capacitors. The purpose of this document is to define a standard approach for evaluating the expected live of GaAs MMICs so that results from different life tests can be compared and so that wording of this document that the MMIC contains at least one FET, but the use of this document has no such limitation. 
languageEnglish
titleJEDEC JEP118num
titleGuidelines for GaAs MMIC and FET Life Testingen
typestandard
page20
statusActive
treeJEDEC - Solid State Technology Association:;1993
contenttypefulltext
subject keywordsFET Life Testing
subject keywordsGaAs FETs
subject keywordsMMIC Life Testing
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