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JEDEC JEP118
Guidelines for GaAs MMIC and FET Life Testing
Organization:
JEDEC - Solid State Technology Association
Year: 1993
Abstract: These guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and capacitors. The purpose of this document is to define a standard approach for evaluating the expected live of GaAs MMICs so that results from different life tests can be compared and so that wording of this document that the MMIC contains at least one FET, but the use of this document has no such limitation.
Subject: FET Life Testing
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T18:04:06Z | |
| date available | 2017-09-04T18:04:06Z | |
| date copyright | 01/01/1993 | |
| date issued | 1993 | |
| identifier other | GFVWCAAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/186976 | |
| description abstract | These guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and capacitors. The purpose of this document is to define a standard approach for evaluating the expected live of GaAs MMICs so that results from different life tests can be compared and so that wording of this document that the MMIC contains at least one FET, but the use of this document has no such limitation. | |
| language | English | |
| title | JEDEC JEP118 | num |
| title | Guidelines for GaAs MMIC and FET Life Testing | en |
| type | standard | |
| page | 20 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;1993 | |
| contenttype | fulltext | |
| subject keywords | FET Life Testing | |
| subject keywords | GaAs FETs | |
| subject keywords | MMIC Life Testing |