JEDEC JEP119A

A Procedure for Performing SWEAT

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T18:14:45Z
date available	2017-09-04T18:14:45Z
date copyright	08/01/2003
date issued	2003
identifier other	HIKGDBAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/197682
description abstract	This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure. This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some test-structures design features are provided in JESD87 and in ASTM 1259M - 96.
language	English
title	JEDEC JEP119A	num
title	A Procedure for Performing SWEAT	en
type	standard
page	32
status	Active
tree	JEDEC - Solid State Technology Association:;2003
contenttype	fulltext
subject keywords	Accelerated Test
subject keywords	Electromigration
subject keywords	SWEAT
subject keywords	Wafer Level