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JEDEC JEP119A
A Procedure for Performing SWEAT
Organization:
JEDEC - Solid State Technology Association
Year: 2003
Abstract: This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure. This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some test-structures design features are provided in JESD87 and in ASTM 1259M - 96.
Subject: Accelerated Test
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T18:14:45Z | |
| date available | 2017-09-04T18:14:45Z | |
| date copyright | 08/01/2003 | |
| date issued | 2003 | |
| identifier other | HIKGDBAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/197682 | |
| description abstract | This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure. This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some test-structures design features are provided in JESD87 and in ASTM 1259M - 96. | |
| language | English | |
| title | JEDEC JEP119A | num |
| title | A Procedure for Performing SWEAT | en |
| type | standard | |
| page | 32 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2003 | |
| contenttype | fulltext | |
| subject keywords | Accelerated Test | |
| subject keywords | Electromigration | |
| subject keywords | SWEAT | |
| subject keywords | Wafer Level |