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JEDEC JESD435
Standard for the Measurement of Small-Signal Transistor Scattering Parameters
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T18:36:39Z | |
| date available | 2017-09-04T18:36:39Z | |
| date copyright | 04/01/1976 (R 2009) | |
| date issued | 2009 | |
| identifier other | JLQISCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/218592 | |
| description abstract | PREFACE The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those published in IEC. | |
| language | English | |
| title | JEDEC JESD435 | num |
| title | Standard for the Measurement of Small-Signal Transistor Scattering Parameters | en |
| type | standard | |
| page | 29 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2009 | |
| contenttype | fulltext |
