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JEDEC JESD435
Standard for the Measurement of Small-Signal Transistor Scattering Parameters
Organization:
JEDEC - Solid State Technology Association
Year: 2009
Abstract: PREFACE
The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those published in IEC.
The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those published in IEC.
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T18:36:39Z | |
| date available | 2017-09-04T18:36:39Z | |
| date copyright | 04/01/1976 (R 2009) | |
| date issued | 2009 | |
| identifier other | JLQISCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/218592 | |
| description abstract | PREFACE The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those published in IEC. | |
| language | English | |
| title | JEDEC JESD435 | num |
| title | Standard for the Measurement of Small-Signal Transistor Scattering Parameters | en |
| type | standard | |
| page | 29 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2009 | |
| contenttype | fulltext |