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JEDEC JEP147

Procedure for Measuring Input Capacitance Using a Vector Network Analyzer (VNA)

Organization:
JEDEC - Solid State Technology Association
Year: 2003

Abstract: This procedure describes a recommended way to measure pin capacitance of devices with SSTL (Stub Series Terminated Logic) interface pins by use of a Vector Network Analyzer. One purpose of this standard procedure is to reduce the lengthy and often inaccurate footnote - usually found around the specification of pin parasitics To a simple reference to this document. In special cases modifying statements may adjust this procedure to the special needs of certain component. 
URI: https://yse.yabesh.ir/std/handle/yse/231397
Subject: Analyzer
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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T18:50:04Z
date available2017-09-04T18:50:04Z
date copyright37895
date issued2003
identifier otherKTOBKBAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/231397
description abstractThis procedure describes a recommended way to measure pin capacitance of devices with SSTL (Stub Series Terminated Logic) interface pins by use of a Vector Network Analyzer. One purpose of this standard procedure is to reduce the lengthy and often inaccurate footnote - usually found around the specification of pin parasitics To a simple reference to this document. In special cases modifying statements may adjust this procedure to the special needs of certain component. 
languageEnglish
titleJEDEC JEP147num
titleProcedure for Measuring Input Capacitance Using a Vector Network Analyzer (VNA)en
typestandard
page11
statusActive
treeJEDEC - Solid State Technology Association:;2003
contenttypefulltext
subject keywordsAnalyzer
subject keywordsDDR SDRAM
subject keywordsDDR2 SDRAM
subject keywordsInput Capacitance
subject keywordsMeasurement Procedures
subject keywordsSSTL_18
subject keywordsSSTL_2
subject keywordsVector Network Analyzer
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