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IEC 60747-10
English -- Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits - Second Edition; Amendment 1: 1995; Amendment 2: 1996; Amendment 3: 08/1996;
French -- Dispositifs à semiconducteurs - Dixième partie: Spécification générique pour les dispositifs discrets et les circuits intégrés - Second Edition; Amendment 1: 1995; Amendment 2: 1996; Amendment 3: 08/1996
Organization:
IEC - International Electrotechnical Commission
Year: 1991
Abstract: This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).
This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:
- measurement methods of electrical characteristics;
- climatic and mechanical tests;
- endurance tests.
NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.
This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:
- measurement methods of electrical characteristics;
- climatic and mechanical tests;
- endurance tests.
NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.
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| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2017-09-04T15:59:46Z | |
| date available | 2017-09-04T15:59:46Z | |
| date copyright | 1991.04.01 | |
| date issued | 1991 | |
| identifier other | RGKJCAAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/62941 | |
| description abstract | This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ). This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for: - measurement methods of electrical characteristics; - climatic and mechanical tests; - endurance tests. NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types. | |
| language | English, French | |
| title | IEC 60747-10 | num |
| title | English -- Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits - Second Edition; Amendment 1: 1995; Amendment 2: 1996; Amendment 3: 08/1996 | en |
| title | French -- Dispositifs à semiconducteurs - Dixième partie: Spécification générique pour les dispositifs discrets et les circuits intégrés - Second Edition; Amendment 1: 1995; Amendment 2: 1996; Amendment 3: 08/1996 | other |
| type | standard | |
| page | 104 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;1991 | |
| contenttype | fulltext |
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